Structural and Optical Characterization of Chemically Deposited PbS Thin Films

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Date

2017-11

Journal Title

Journal ISSN

Volume Title

Type

Article

Publisher

Springer

Series Info

SILICON;Volume: 9 Issue: 6 Pages: 809-816

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Abstract

PbS thin films were deposited on glass substrates by a chemical bath depositionmethod. The effect of varying the film thickness on the structural and optical properties has been investigated. XRD analysis reveals the crystallinity of the deposited PbS films with (200) preferred crystal orientation. Increasing the film thickness enhances the crystallinity of the films as well as decreases the strain and dislocation density. The surface morphology features were dramatically changed from small spherical grains to bead-like shape. The absence of impurities in the deposited films was confirmed by energy dispersive x-ray spectrometry (EDX) measurements. The optical constants of the deposited films were calculated and a small decrease in the band gap energy was observed with increasing the film thickness.

Description

Accession Number: WOS:000413701100002

Keywords

University for NANO, PARAMETERS, ABSORPTION, NANOCRYSTALS, GROWTH, ROOM-TEMPERATURE, BATH DEPOSITION, XRD, Surface morphology, Chemical bath deposition, PbS films

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