Fabrication and characterization of Copper/Silicon Nitride composites

dc.AffiliationOctober University for modern sciences and Arts (MSA)
dc.contributor.authorEl-Nikhaily, Ahmed E.
dc.contributor.authorDaoush, Walid M
dc.contributor.authorAhmed, Mahmoud A
dc.date.accessioned2019-12-22T14:00:19Z
dc.date.available2019-12-22T14:00:19Z
dc.date.issued2016-09
dc.descriptionAccession Number: WOS:000390910100001en_US
dc.description.abstractCopper/silicon nitride (Cu/Si3N4) composites are fabricated by powder technology process. Copper is used as metal matrix and very fine Si3N4 particles (less than 1 micron) as reinforcement material. The investigated powder were used to prepare homogenous (Cu/Si3N4) composite mixtures with different Si3N4 weight percentage (2, 4, 6, 8 and10). The produced mixtures were cold pressed and sintered at different temperatures (850, 950, 1000, 1050 degrees C). The microstructure and the chemical composition of the produced Cu/Si3N4 composites were investigated by (SEM) and XRD. It was observed that the Si3N4 particles were homogeneously distributed in the Cu matrix. The density, electrical conductivity and coefficient of thermal expansion of the produced Cu/Si3N4 composites were measured. The relative green density, sintered density, electrical conductivity as well as coefficient of thermal expansion were decreased by increasing the reinforcement phase (Si3N4) content in the copper matrix. It is also founded that the sintered density and electrical conductivity of the Cu/Si3N4 composites were increased by increase the sintering temperature.en_US
dc.description.urihttps://www.scimagojr.com/journalsearch.php?q=21100847372&tip=sid&clean=0
dc.identifier.doihttps://doi.org/10.12989/amr.2016.5.3.131
dc.identifier.issn2234-0912
dc.identifier.otherhttps://doi.org/10.12989/amr.2016.5.3.131
dc.identifier.urihttp://www.techno-press.org/fulltext/j_amr/amr5_3/amr0503001.pdf
dc.language.isoen_USen_US
dc.publisherTECHNO-PRESSen_US
dc.relation.ispartofseriesADVANCES IN MATERIALS RESEARCH-AN INTERNATIONAL JOURNAL;Volume: 5 Issue: 3 Pages: 131-140
dc.relation.urihttps://t.ly/mO1zx
dc.subjectUniversity for PARTICLESen_US
dc.subjectELECTRODEPOSITIONen_US
dc.subjectCOATINGSen_US
dc.subjectCOPPERen_US
dc.subjectcoefficient of thermal expansionen_US
dc.subjectelectrical conductivityen_US
dc.subjectsinteringen_US
dc.subjectpowder metallurgyen_US
dc.subjectSilicon Nitridesen_US
dc.subjectCopperen_US
dc.titleFabrication and characterization of Copper/Silicon Nitride compositesen_US
dc.typeArticleen_US

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