The effect of different gamma doses on some properties of a CR-39 detector

Abstract

In the current study, the bulk etch rate, the removal thickness percentage and the track density have been examined for gamma-irradiated at doses ranging from 0 to 100 kGy. After irradiating CR-39 detectors, they got etched at 70C in different concentration of NaOH solutions for various time intervals. Results indicate that the bulk etch rate and the removal thickness percentage increase with the increase of gamma absorbed dose and the etchant solution concentration. The track density increases with increase of the etchant solution concentration for irradiated samples (0, 10, 50 kGy) up to 6.25 N NaOH, and then it decreases with the increase of the etchant solution concentration for un-irradiated samples and those irradiated with 10 kGy, and with the high doses the samples surface got damaged.