A Comparative Study of Machine Learning and Deep Learning in Network Anomaly-Based Intrusion Detection Systems

dc.AffiliationOctober University for modern sciences and Arts (MSA)
dc.contributor.authorAbdel-Wahab, M.S
dc.contributor.authorNeil, A.M
dc.contributor.authorAtia, A
dc.date.accessioned2021-02-26T09:08:13Z
dc.date.available2021-02-26T09:08:13Z
dc.date.issued2020-12
dc.descriptionScopusen_US
dc.description.abstractThis paper presents a comparative study of Machine learning and Deep learning models used in anomaly-based network intrusion detection systems. The paper has presented an overview of the previous work done in the field of ML and DL IDS, then an overview of the used datasets in reviewed literature was presented. Moreover, ML and DL models were tested on the KDD-99 dataset, and performance results were presented, compared, and discussed. Finally, areas of future research of critical importance are proposed by the authors. © 2020 IEEE.en_US
dc.description.sponsorshipAin Shams University (ASU),IEEE Egypt Sectionen_US
dc.description.urihttps://www.scimagojr.com/journalsearch.php?q=21100901750&tip=sid&clean=0
dc.identifier.doihttps://doi.org/10.1109/ICCES51560.2020.9334553
dc.identifier.isbn978-073810559-8
dc.identifier.otherhttps://doi.org/10.1109/ICCES51560.2020.9334553
dc.identifier.urihttps://qrgo.page.link/mUik3
dc.language.isoen_USen_US
dc.publisherInstitute of Electrical and Electronics Engineers Inc.en_US
dc.relation.ispartofseriesProceedings of ICCES 2020 - 2020 15th International Conference on Computer Engineering and Systems 15 December 2020, Article number 9334553 15th International Conference on Computer Engineering and Systems, ICCES 2020;Virtual, Cairo; Egypt; 15 December 2020 through 16 December 2020; Category numberCFP2054A-ART; Code 166892;
dc.subjectuniversityen_US
dc.subjectcomparativeen_US
dc.subjectdeep learningen_US
dc.subjectintrusion detectionen_US
dc.subjectmachine learningen_US
dc.titleA Comparative Study of Machine Learning and Deep Learning in Network Anomaly-Based Intrusion Detection Systemsen_US
dc.typeArticleen_US

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