A modified pseudo 2D physically-based model for double-gate TFETs: Role of precise calculations of drain and source depletion regions

dc.AffiliationOctober University for modern sciences and Arts (MSA)
dc.contributor.authorYahia, Yasmin
dc.contributor.authorSalem, Marwa S
dc.contributor.authorShaker, A
dc.contributor.authorKamel, H
dc.contributor.authorAbouelatta, M
dc.contributor.authorElBanna, M
dc.date.accessioned2021-07-18T13:25:16Z
dc.date.available2021-07-18T13:25:16Z
dc.date.issued7/14/2021
dc.description.abstractIn this current study, a modified pseudo two-dimensional (2-D) semi-analytical model for double gate tunnel FETs (DG-TFETs) is introduced. The main regions in the DG-TFET structure are the channel and the depletion regions inside the source and the drain. In such regions, the 2-D Poisson’s equation is solved by adjusting suitable boundary conditions. The source and the drain depletion region lengths are calcu- lated precisely by an iterative technique resulting in an accurate prediction of the electrostatic potential. According to the obtained 2-D electrostatic potential, the energy band diagram could be extracted and, consequently, the minimum tunneling width is calculated. Accordingly, the model of drain current is introduced by applying Kane’s tunneling model. Further, the source depletion charge and the channel charge are derived, and the terminal capacitance components are then extracted. A comparison between the proposed model and SILVACO TCAD simulations shows a satisfactory agreement that confirms the validation of the presented model robustness. 2021 THE AUTHORS. Published by Elsevier BV on behalf of Faculty of Engineering, Ain Shams Uni- versity. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/ by-nc-nd/4.0/).en_US
dc.description.urihttps://www.scimagojr.com/journalsearch.php?q=19700200705&tip=sid&clean=0
dc.identifier.doihttps://doi.org/10.1016/j.asej.2021.06.025
dc.identifier.otherhttps://doi.org/10.1016/j.asej.2021.06.025
dc.identifier.urihttps://qrgo.page.link/KkVtb
dc.language.isoen_USen_US
dc.publisherElsevieren_US
dc.relation.ispartofseriesAin Shams Engineering Journal;
dc.subjectDG-TFETen_US
dc.subjectDepletion regionsen_US
dc.subjectTunneling widthen_US
dc.subjectPoisson’s equationen_US
dc.subjectSurface potentialen_US
dc.titleA modified pseudo 2D physically-based model for double-gate TFETs: Role of precise calculations of drain and source depletion regionsen_US
dc.typeArticleen_US

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