Abouelatta M.; Salem M.S.; Shaker A.; Elbanna M.; Zekry A.; Gontrand C.
(Natural Sciences PublishingSpringer, 2019)
In this letter, a planar integration using the deep trench isolation (DTI) technique is proposed to suppress the inter-well parasites in smart power integrated circuits implemented in 0.35��m BiCMOS technology. In this ...